Thermal probe self-calibration in ac scanning thermal microscopy

Superlattices and Microstructures

Volumn 35, Issue 3-6, 2004, Pages 305-314

  Chirtoc, M ^a   Filip, X ^a   Henry, J F ^b   Antoniow, J S ^b   Chirtoc, I ^a   Dietzel, D ^c   Meckenstock, R ^c   Pelzl, J ^c  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

^b UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^c RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

3 method; Adiabatic mode; IR thermography; Isothermal mode; Scanning thermal microscopy (SThM); Thermal probe calibration

Indexed keywords

ATOMIC FORCE MICROSCOPY; HEAT LOSSES; HEAT RESISTANCE; PROBES; SUPERLATTICES; THERMODYNAMIC PROPERTIES; THERMOGRAPHY (IMAGING); TRANSDUCERS;

ADIABATIC MODES; ISOTHERMAL MODES; SCANNING THERMAL MICROSCOPY (STHM); THERMAL PROBE CALIBRATION;

FREQUENCY RESPONSE;

EID: 4243117311     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2003.09.002     Document Type: Conference Paper

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