Multifrequential AC modeling of the SThM probe behavior

International Journal of Thermal Sciences

Volumn 46, Issue 10, 2007, Pages 980-988

  Grossel, Philippe ^a   Raphaël, Olivier ^a   Depasse, Françoise ^a   Duvaut, Thierry ^a   Trannoy, Nathalie ^a  

^a EA 3802   (France)

Author keywords

3 method; Scanning thermal microscopy; Thermal modeling

Indexed keywords

SCANNING THERMAL MICROSCOPE; THERMAL MODELING;

COMPUTER SIMULATION; FINITE ELEMENT METHOD; MICROSCOPIC EXAMINATION; PARAMETER ESTIMATION; THERMAL CONDUCTIVITY;

SURFACE PROPERTIES;

EID: 34447636910     PISSN: 12900729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijthermalsci.2006.12.004     Document Type: Article

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