Modelling for the thermal characterization of solid materials by dc scanning thermal microscopy

Journal of Physics D: Applied Physics

Volumn 40, Issue 14, 2007, Pages 4337-4346

  David, L ^a   Gomes S ^a   Raynaud, M ^a  

^a UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANEMOMETERS; DIFFERENTIAL SCANNING CALORIMETRY; SENSITIVITY ANALYSIS; THERMAL CONDUCTIVITY; THERMOANALYSIS; THIN FILMS;

SCANNING THERMAL MICROSCOPY; SOLID MATERIALS; SUBSURFACE VOLUMES;

SOLIDS;

EID: 34547333454     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/14/032     Document Type: Article

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