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Volumn 185, Issue 10, 2012, Pages 330-339

Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES

Author keywords

Fermi surface; HAXPES; Immersion lens; Photoemission microscopy; Spectromicroscopy; XPS

Indexed keywords

BAND PASS; COMPLEX MATERIALS; ENERGY FILTER; HARD X RAY; HAXPES; IMMERSION LENS; LATERAL RESOLUTION; NANO SCALE; PARALLEL IMAGING; PHOTOELECTRON EMISSION MICROSCOPES; PHOTOEMISSION MICROSCOPY; SPECTROMICROSCOPY;

EID: 84870056051     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2012.08.003     Document Type: Article
Times cited : (71)

References (54)
  • 24
    • 84870973719 scopus 로고    scopus 로고
    • http://www.omicron.de/en/products/nanoesca-/instrument-concept
  • 25
    • 84870956658 scopus 로고    scopus 로고
    • http://www.focus-gmbh.com/page2/page14/page17/page17.html
  • 45


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.