Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation

Review of Scientific Instruments

Volumn 83, Issue 6, 2012, Pages

  Wiemann, C ^a   Kaiser, A M ^a   Cramm, S ^a   Schneider, C M ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON OPTICAL SYSTEM; ELECTROSTATIC DEFLECTORS; FAST SWITCHING; GATING TECHNIQUES; PHOTOEMISSION MICROSCOPE; PICOSECOND REGIME; SWITCHING TIME; SYNCHROTRON RADIATION SOURCE; TIME RESOLVED MEASUREMENT; TIME-RESOLVED;

ELECTRON MICROSCOPY; OPTICAL SYSTEMS; SYNCHROTRON RADIATION;

PHOTOEMISSION;

EID: 84863534836     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4729603     Document Type: Review

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