Spin resolved photoelectron microscopy using a two-dimensional spin-polarizing electron mirror

Applied Physics Letters

Volumn 99, Issue 3, 2011, Pages

  Tusche, C ^a   Ellguth, M ^a   Unal A A ^a   Chiang, C T ^a   Winkelmann, A ^a   Krasyuk, A ^a   Hahn, M ^b   Schonhense G ^b   Kirschner, J ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE OF INCIDENCE; ELECTRON MIRRORS; FIELD OF VIEWS; LOW ENERGY ELECTRONS; PHOTOELECTRON EMISSION MICROSCOPY; PHOTOELECTRON MICROSCOPY; POSITION-SENSITIVE DETECTORS; SPECULAR REFLECTIONS; SPIN FILTERING; SPIN-ORBIT COUPLINGS; TWO-DIMENSIONAL IMAGES;

COBALT; ELECTRONS; MAGNETIC DOMAINS; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; PHOTONS; SINGLE CRYSTALS; TUNGSTEN;

TWO DIMENSIONAL;

EID: 79960785939     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3611648     Document Type: Article

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