Selected-area diffraction and spectroscopy in LEEM and PEEM

Ultramicroscopy

Volumn 120, Issue , 2012, Pages 73-77

  Tromp, R M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Chromatic aberration; Dispersion; LEEM; PEEM; Selected area diffraction; Selected area spectroscopy; Spherical aberration

Indexed keywords

CHROMATIC ABERRATION; LEEM; PEEM; SELECTED AREA DIFFRACTION; SPHERICAL ABERRATIONS;

DISPERSION (WAVES); ELECTRON SPECTROSCOPY;

ABERRATIONS;

ARTICLE; CALCULATION; CONTROLLED STUDY; DIFFRACTION; ELECTRON; ELECTRON MICROSCOPY; GEOMETRY; IMAGE ANALYSIS; LOW ENERGY ELECTRON MICROSCOPY; MAGNETIC FIELD; PHOTO ELECTRON EMISSION MICROSCOPY; PRISM; SIMULATION;

EID: 84864153388     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.06.003     Document Type: Article

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