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Volumn 101, Issue 21, 2012, Pages

Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG BEAMS; COUPLED DEVICES; ELECTRON DETECTION; ELECTRON DETECTORS; ELECTRON PROBE; FRAME TIME; LAYER STACKS; NM RESOLUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR NANOSTRUCTURES; SIGNIFICANT POINTS; STRAIN MAPPING;

EID: 84870009578     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4767655     Document Type: Article
Times cited : (67)

References (27)
  • 12
    • 77952320736 scopus 로고    scopus 로고
    • 10.1016/j.ultramic.2009.11.023
    • W. Yu and W. Mader, Ultramicroscopy 110, 411 (2010). 10.1016/j.ultramic. 2009.11.023
    • (2010) Ultramicroscopy , vol.110 , pp. 411
    • Yu, W.1    Mader, W.2
  • 21
    • 84871032560 scopus 로고    scopus 로고
    • A pnCCD-based, fast direct single electron imaging camera for transmission electron microscopy
    • (unpublished)
    • H. Ryll, I. Ordavo, K. Müller, S. Ihle, H. Soltau, and L. Strüder, A pnCCD-based, fast direct single electron imaging camera for transmission electron microscopy., Microsc. Microanal. (unpublished).
    • Microsc. Microanal.
    • Ryll, H.1    Ordavo, I.2    Müller, K.3    Ihle, S.4    Soltau, H.5    Strüder, L.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.