Characterization of a direct detection device imaging camera for transmission electron microscopy

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 741-744

  Milazzo, Anna Clare ^a   Moldovan, Grigore ^b   Lanman, Jason ^c   Jin, Liang ^a   Bouwer, James C ^a   Klienfelder, Stuart ^d   Peltier, Steven T ^a   Ellisman, Mark H ^a   Kirkland, Angus I ^b   Xuong, Nguyen Huu ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c SCRIPPS RESEARCH INSTITUTE   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Active pixel sensor; CMOS detectors; Direct detection device; DQE; MTF; Transmission electron microscopy

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRON ENERGY LEVELS; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; TRANSMISSION ELECTRON MICROSCOPY; VIRUSES;

ACTIVE PIXEL SENSOR; CMOS DETECTORS; DIRECT DETECTION; HIGH RESOLUTION CAMERA; HIGH-PERFORMANCE PLATFORMS; PRIMARY ELECTRONS; VIRUS PARTICLES; WIDE FIELD OF VIEW;

CCD CAMERAS;

ARTICLE; CAMERA; DROSOPHILA; ELECTRON; IMAGE ANALYSIS; MODULATION TRANSFER FUNCTION; QUANTUM YIELD; SENSITIVITY ANALYSIS; SENSOR; SIGNAL NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY; VIRUS PARTICLE;

EID: 77953538191     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.03.007     Document Type: Article

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