Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials

Journal of Applied Crystallography

Volumn 45, Issue 6, 2012, Pages 1109-1124

  Lvarez Murga, M ^a,b   Bleuet, P ^c   Hodeau, J L ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CNRS   (France)

^c CEA GRENOBLE   (France)

Author keywords

diffraction imaging; diffraction scattering computed tomography; structural characterization

Indexed keywords

AMORPHOUS PHASIS; CHARACTERIZATION METHODS; COMPUTED TOMOGRAPHY; CONTRAST SENSITIVITY; DIFFRACTION AND SCATTERING; DIFFRACTION IMAGING; LOCAL PATTERNS; NON DESTRUCTIVE; ORDERED PHASIS; POLYCRYSTALLINE; RECONSTRUCTION ARTEFACTS; SCATTERING SIGNALS; STRUCTURAL CHARACTERIZATION; STRUCTURAL IMAGING; STRUCTURAL PROBES; WEAK SIGNALS;

AMORPHOUS MATERIALS; CHARACTERIZATION; COMPUTERIZED TOMOGRAPHY; CRYSTALLOGRAPHY; DIFFRACTION; TOMOGRAPHY;

THREE DIMENSIONAL;

EID: 84869202285     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812041039     Document Type: Article

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