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International Journal of Materials Research

Volumn 103, Issue 2, 2012, Pages 192-199

Imaging of grain-level orientation and strain in thicker metallic polycrystals by high energy transmission micro-beam Laue (HETL) diffraction techniques

(7) Hofmann, Felix a Abbey, Brian b Connor, Leigh c Baimpas, Nikolaos a Song, Xu a Keegan, Sinéad d Korsunsky, Alexander M a

a UNIVERSITY OF OXFORD (United Kingdom)

b UNIVERSITY OF MELBOURNE (Australia)

c DIAMOND LIGHT SOURCE LTD (United Kingdom)

d DUBLIN INSTITUTE FOR ADVANCED STUDIES (Ireland)

Author keywords

Differential aperture X raymicroscopy; Grain level deformation; Micro beam Laue diffraction; Synchrotron X ray diffraction; Tomography

Indexed keywords

AEROSPACE COMPONENTS; ALTERNATIVE APPROACH; BULK PROPERTIES; COMPLEX LOADING; DEFORMATION BEHAVIOUR; DIFFERENTIAL APERTURE; DIFFRACTION TECHNIQUES; ELASTIC STRAIN; ENGINEERING COMPONENTS; FATIGUE LOADINGS; HIGH ENERGY; IN-DEPTH UNDERSTANDING; KNOW-HOW; LATTICE ORIENTATIONS; LAUE DIFFRACTION; LAUE TECHNIQUE; MATERIAL BEHAVIOUR; MATERIAL FAILURES; MATERIAL SCIENTISTS; MICRO BEAMS; PHOTON ENERGY; RECENT PROGRESS; SAFETY CRITICAL APPLICATIONS; SAMPLE SURFACE; SYNCHROTRON X-RAY DIFFRACTION; THIN SECTION; THREE DIMENSIONS; X RAY MICROSCOPY;

PHOTONS; POLYCRYSTALS; TOMOGRAPHY; X RAY DIFFRACTION;

HIGH ENERGY PHYSICS;

EID: 84857526464 PISSN: 18625282 EISSN: None Source Type: Journal
DOI: 10.3139/146.110660 Document Type: Review

Times cited : (25)

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