Nondestructive three-dimensional elemental microanalysis by combined helical x-ray microtomographies

Applied Physics Letters

Volumn 84, Issue 12, 2004, Pages 2199-2201

  Golosio, Bruno ^a,c   Somogyi, Andrea ^a   Simionovici, Alexandre ^a,b   Bleuet, Pierre ^a   Susini, Jean ^a   Lemelle, Laurence ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITÉ DE LYON   (France)

^c UNIVERSITY OF SASSARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CONDENSATION; FLUORESCENCE; FLY ASH; MICROANALYSIS; PHOTONS; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VAPORIZATION;

COMPTON TOMOGRAPHY; FOCUSED ION BEAM (FIB) TOMOGRAPHY; MICROTOMOGRAPHY;

X RAY ANALYSIS;

EID: 1942476804     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1686892     Document Type: Article

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