Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 3-4, 2010, Pages 291-296

  King, A ^b   Herbig, M ^a   Ludwig, W ^a,c   Reischig, P ^c   Lauridsen, E M ^d   Marrow, T ^e   Buffiere J Y ^a  

^a UNIVERSITÉ DE LYON   (France)

^b INSTITUTE OF MATERIALS RESEARCH   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^e UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Crystal morphology and orientation; Grain boundary character; Polycrystal; X ray diffraction contrast tomography

Indexed keywords

CHARACTERIZATION; CHEMICAL ANALYSIS; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; POLYCRYSTALS; SINGLE CRYSTALS; TOMOGRAPHY;

CHARACTERIZATION TECHNIQUES; CRYSTAL MORPHOLOGIES; CRYSTALLOGRAPHIC ORIENTATIONS; GRAIN BOUNDARY CHARACTER; INDIVIDUAL GRAIN BOUNDARIES; NON-DESTRUCTIVE ANALYSIS; X-RAY DIFFRACTION MICROSCOPY; X-RAY MICRO TOMOGRAPHIES;

X RAY DIFFRACTION;

EID: 75849156052     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.07.020     Document Type: Article

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