Hard X-ray diffraction scanning tomography with sub-micrometre spatial resolution: Application to an annealed γ-U 0.85Mo 0.15 particle

Journal of Applied Crystallography

Volumn 44, Issue 5, 2011, Pages 1111-1119

  Palancher, Hervé ^a   Tucoulou, Rémi ^b   Bleuet, Pierre ^c   Bonnin, Anne ^a,b   Welcomme, Eléonore ^a,d   Cloetens, Peter ^b  

^a IRFM   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c CEA GRENOBLE   (France)

^d DIF   (France)

Author keywords

non proliferation; nuclear fuels; Rietveld method; sub micrometre resolution; X ray diffraction tomography; X ray powder diffraction

Indexed keywords

HARD X RAY; NON-PROLIFERATION; POLYCRYSTALLINE SAMPLES; REAL-SPACE; SCANNING TOMOGRAPHY; SEMI-QUANTITATIVE; SPATIAL RESOLUTION; SPHERICAL PARTICLE; STRUCTURAL INFORMATION; THERMALLY ACTIVATED; TRACE LEVEL; X-RAY DIFFRACTION TOMOGRAPHY; X-RAY POWDER;

IMAGE RESOLUTION; NUCLEAR FUELS; PHASE INTERFACES; RIETVELD METHOD; TOMOGRAPHY; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

THREE DIMENSIONAL;

EID: 80053003111     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811024423     Document Type: Article

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