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Volumn 14, Issue 4-5, 1996, Pages 235-248

Two-dimensional detector software: From real detector to idealised image or two-theta scan

Author keywords

Area detectors; Data analysis; Detector calibration; Detector distortions; Distortion correction; Powder diffraction

Indexed keywords

CALIBRATION; COMPUTER SOFTWARE; DATA REDUCTION; DIFFRACTION; ERROR ANALYSIS; GEOMETRY; SIGNAL DISTORTION;

EID: 0029695129     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4571)

References (32)
  • 1
    • 0026455280 scopus 로고
    • Signal fading, erasure, and re-scan in storage phosphor imaging
    • C. C. Shaw, J. M. Herron and D. Gur, "Signal fading, erasure, and re-scan in storage phosphor imaging", SPIE, 1651, 156-162 (1992).
    • (1992) SPIE , vol.1651 , pp. 156-162
    • Shaw, C.C.1    Herron, J.M.2    Gur, D.3
  • 2
    • 0346018867 scopus 로고
    • 2D detectors for synchrotron X-ray sources, some comparative tests
    • C. J. Hall, R. A. Lewis, B. Parker and J. Worgan, "2D detectors for synchrotron X-ray sources, some comparative tests", Nucl. Instr. Meth., A 310, 215-219 (1991).
    • (1991) Nucl. Instr. Meth., A , vol.310 , pp. 215-219
    • Hall, C.J.1    Lewis, R.A.2    Parker, B.3    Worgan, J.4
  • 3
    • 25344462611 scopus 로고
    • Evaluation of X-ray Diffraction Data for Protein Crystals by Use of an Imaging Plate
    • I. Fujii, Y. Morimoto, Y. Higuchi, N. Yasoka, C. Katayama and K. Miki, "Evaluation of X-ray Diffraction Data for Protein Crystals by Use of an Imaging Plate", Acta Cryst., B 47, 137-144 (1991).
    • (1991) Acta Cryst., B , vol.47 , pp. 137-144
    • Fujii, I.1    Morimoto, Y.2    Higuchi, Y.3    Yasoka, N.4    Katayama, C.5    Miki, K.6
  • 5
    • 0028463920 scopus 로고
    • Calibration and correction of spatial distortions in 2D detector systems
    • A. P. Hammersley, S. O. Svensson and A. Thompson "Calibration and correction of spatial distortions in 2D detector systems", Nucl. Instr. Meth. Section A, A346, 312-321 (1994).
    • (1994) Nucl. Instr. Meth. Section A , vol.A346 , pp. 312-321
    • Hammersley, A.P.1    Svensson, S.O.2    Thompson, A.3
  • 6
    • 0026932820 scopus 로고
    • Correcting Spatial Distortions and Nonuniform Response in Area Detectors
    • M. Stanton, W. C. Philips, Y. Li and K. Kalata "Correcting Spatial Distortions and Nonuniform Response in Area Detectors", J. Appl. Cryst., 25, 549-558 (1992).
    • (1992) J. Appl. Cryst. , vol.25 , pp. 549-558
    • Stanton, M.1    Philips, W.C.2    Li, Y.3    Kalata, K.4
  • 7
    • 0042925298 scopus 로고
    • Calibrating an area-detector diffractometer: Imaging geometry
    • D. J. Thomas "Calibrating an area-detector diffractometer: imaging geometry", Proc. R. Soc. Lond., A 425, 129-167 (1989).
    • (1989) Proc. R. Soc. Lond., A , vol.425 , pp. 129-167
    • Thomas, D.J.1
  • 8
    • 3042987212 scopus 로고
    • Calibrating an area-detector diffractometer: Integral response
    • D. J. Thomas "Calibrating an area-detector diffractometer: integral response", Proc. R. Soc. Lond., A 428, 181-214 (1990).
    • (1990) Proc. R. Soc. Lond., A , vol.428 , pp. 181-214
    • Thomas, D.J.1
  • 10
    • 0347263979 scopus 로고
    • Calibration Tests and Use of a Nicolet/Xentronics Imaging Proportional Chamber Mounted on a Conventional Source for Protein Crystallography
    • Z. Derewenda and J. Helliwell "Calibration Tests and Use of a Nicolet/Xentronics Imaging Proportional Chamber Mounted on a Conventional Source for Protein Crystallography", J. Appl. Cryst., 22, 123-137 (1989).
    • (1989) J. Appl. Cryst. , vol.22 , pp. 123-137
    • Derewenda, Z.1    Helliwell, J.2
  • 11
    • 85027633237 scopus 로고
    • Crystal Orientation and X-ray Pattern Prediction Routines for Area-Detector Diffractometer Systems in Macromolecular Crystallography
    • A. Messerschmidt and J. W. Pflugrath, "Crystal Orientation and X-ray Pattern Prediction Routines for Area-Detector Diffractometer Systems in Macromolecular Crystallography", J. Appl. Cryst., 20, 306-315 (1987).
    • (1987) J. Appl. Cryst. , vol.20 , pp. 306-315
    • Messerschmidt, A.1    Pflugrath, J.W.2
  • 12
    • 85046526624 scopus 로고
    • Evaluation of Single Crystal X-ray Diffraction Data from a Position Sensitive Detector
    • W. Kabsch, "Evaluation of Single Crystal X-ray Diffraction Data from a Position Sensitive Detector", J. Appl. Cryst., 21, 916-924 (1988).
    • (1988) J. Appl. Cryst. , vol.21 , pp. 916-924
    • Kabsch, W.1
  • 13
    • 0542375063 scopus 로고
    • Spatial-Distortion Corrections, for Laue Diffraction Patterns Recorded on Image Plates, Modelled using Polynomial Functions
    • J. W. Campbell, M. M. Harding and B. Kariuki "Spatial-Distortion Corrections, for Laue Diffraction Patterns Recorded on Image Plates, Modelled using Polynomial Functions", J. Appl. Cryst., 28, 43-48 (1995).
    • (1995) J. Appl. Cryst. , vol.28 , pp. 43-48
    • Campbell, J.W.1    Harding, M.M.2    Kariuki, B.3
  • 15
    • 0012006046 scopus 로고
    • High Precision Powder X-ray Diffraction Measurements at High Pressures
    • C. Meade and R. Jeanloz "High Precision Powder X-ray Diffraction Measurements at High Pressures", Rev. Sci. Instrum., 61, 2571-2580 (1990).
    • (1990) Rev. Sci. Instrum. , vol.61 , pp. 2571-2580
    • Meade, C.1    Jeanloz, R.2
  • 16
    • 84963455382 scopus 로고
    • The Development of Synchrotron X-ray Area Detectors for Studying High Pressure Phase Transitions
    • R. J. Cernik, S. M. Clark, A. M. Deacon, C. J. Hall and P. Pattison "The Development of Synchrotron X-ray Area Detectors for Studying High Pressure Phase Transitions", Phase Transitions, 39, 187-198 (1992).
    • (1992) Phase Transitions , vol.39 , pp. 187-198
    • Cernik, R.J.1    Clark, S.M.2    Deacon, A.M.3    Hall, C.J.4    Pattison, P.5
  • 19
    • 36448998797 scopus 로고
    • A Computer Program to Analyze X-ray Diffraction Films
    • J. H. Nguyen and R. Jeanloz "A Computer Program to Analyze X-ray Diffraction Films", Rev. Sci. Instrum., 64, 3456-3461 (1993).
    • (1993) Rev. Sci. Instrum. , vol.64 , pp. 3456-3461
    • Nguyen, J.H.1    Jeanloz, R.2
  • 20
    • 0028753777 scopus 로고
    • Using a Two-Dimensional Detector for X-ray Powder Diffraction
    • S. N. Sulyanov, A. N. Popov and D. M. Kheiker "Using a Two-Dimensional Detector for X-ray Powder Diffraction", J. Appl. Cryst., 27, 934-942 (1994).
    • (1994) J. Appl. Cryst. , vol.27 , pp. 934-942
    • Sulyanov, S.N.1    Popov, A.N.2    Kheiker, D.M.3
  • 21
    • 3042861511 scopus 로고
    • Physics Department, University of Edinburgh
    • R. O. Piltz "PLATYPUS User Manual", Physics Department, University of Edinburgh (1993).
    • (1993) PLATYPUS User Manual
    • Piltz, R.O.1
  • 22
    • 0005936784 scopus 로고
    • EXP/AH/95-01, FIT2D V6.4 Reference Manual V1.18
    • A. P. Hammersley ESRF Internal Report, EXP/AH/95-01, FIT2D V6.4 Reference Manual V1.18 (1995).
    • (1995) ESRF Internal Report
    • Hammersley, A.P.1
  • 23
    • 3042915371 scopus 로고
    • The Development of a Full Profile Analysis of Single-Crystal X-ray Diffraction Data
    • D. J. Thomas "The Development of a Full Profile Analysis of Single-Crystal X-ray Diffraction Data", J. de Physique, Supplément au No 8, Tome 47 (1986).
    • (1986) J. de Physique, Supplément Au No 8 , vol.47
    • Thomas, D.J.1
  • 24
    • 3042923470 scopus 로고
    • Msc. Thesis, School of Information Science and Technology, Liverpool Polytechnic
    • M. Wahl Msc. Thesis, School of Information Science and Technology, Liverpool Polytechnic (1991).
    • (1991)
    • Wahl, M.1
  • 26
    • 3042947360 scopus 로고    scopus 로고
    • A.D. Murry and A. Fitch, Powder Diffraction Program Library (PDPL),University College London, UK
    • A.D. Murry and A. Fitch, Powder Diffraction Program Library (PDPL),University College London, UK.
  • 27
    • 0001367601 scopus 로고
    • Macromolecular Crystallography with Synchrotron Radiation: Photographic Data Collection and Polarization correction
    • R. Kahn, R. Fourme, A. Gadet, J. Janin, C. Dumas and D. André "Macromolecular Crystallography with Synchrotron Radiation: Photographic Data Collection and Polarization correction", J. Appl. Cryst., 15, 330-337 (1982).
    • (1982) J. Appl. Cryst. , vol.15 , pp. 330-337
    • Kahn, R.1    Fourme, R.2    Gadet, A.3    Janin, J.4    Dumas, C.5    André, D.6
  • 28
    • 0028699729 scopus 로고
    • An Overview of NIST Powder Diffraction Standard Reference Materials
    • J. P. Cline "An Overview of NIST Powder Diffraction Standard Reference Materials", Materials Science Forum, 166-169, 127-134 (1994).
    • (1994) Materials Science Forum , vol.166-169 , pp. 127-134
    • Cline, J.P.1
  • 30
    • 0028728552 scopus 로고
    • Experimental Whole Powder pattern Intensity Calibration in X-ray Powder Diffractometry (XRPD)
    • A. Kern and W. Eysel "Experimental Whole Powder pattern Intensity Calibration in X-ray Powder Diffractometry (XRPD)", Materials Science Forum, 166-169, 135-140 (1994).
    • (1994) Materials Science Forum , vol.166-169 , pp. 135-140
    • Kern, A.1    Eysel, W.2
  • 31
    • 0022769795 scopus 로고
    • Correction of Intensities for Preferred Orientation in Powder Diffractometry: Application of the March model
    • W. A. Dollase "Correction of Intensities for Preferred Orientation in Powder Diffractometry: Application of the March model", J. Appl. Cryst., 19, 267 (1986).
    • (1986) J. Appl. Cryst. , vol.19 , pp. 267
    • Dollase, W.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.