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Volumn 308, Issue 5718, 2005, Pages 92-95
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Simultaneous tomography and diffraction analysis of creep damage
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Author keywords
[No Author keywords available]
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Indexed keywords
HIGH TEMPERATURE EFFECTS;
NUCLEATION;
SYNCHROTRON RADIATION;
TOMOGRAPHY;
X RAY DIFFRACTION ANALYSIS;
CREEP DAMAGE;
EXPONENTIAL GROWTH;
VOID GROWTH;
VOID NUCLEATION;
CREEP;
CREEP;
DAMAGE;
FRACTURE MECHANICS;
ANALYTIC METHOD;
ARTICLE;
EVOLUTION;
EXPERIMENT;
HIGH TEMPERATURE;
PREDICTION;
PRIORITY JOURNAL;
SAMPLING;
STEADY STATE;
SYNCHROTRON;
TOMOGRAPHY;
X RAY ANALYSIS;
X RAY CRYSTALLOGRAPHY;
X RAY DIFFRACTION;
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EID: 16344379391
PISSN: 00368075
EISSN: None
Source Type: Journal
DOI: 10.1126/science.1106778 Document Type: Article |
Times cited : (96)
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References (18)
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