Three-dimensional imaging of crystal defects by 'topo-tomography'

Journal of Applied Crystallography

Volumn 34, Issue 5, 2001, Pages 602-607

  Ludwig, W ^a   Cloetens, P ^a   Hartwig J ^a   Baruchel, J ^a   Hamelin, B ^b   Bastie, P ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUT LAUE LANGEVIN   (France)

^c Laboratoire de Spectrometrie Physique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CONTRAST ENHANCEMENT; CRYSTAL; STRUCTURE ANALYSIS; TECHNIQUE; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

EID: 0034790337     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188980101086X     Document Type: Article

References (11)

1. Chikaura, Y., Yoneda, Y. & Hildebrandt, G. (1982). J. Appl. Cryst. 15, 48-54.
2. Feldkamp, L. A., Davis, L. C. & Kress, J. W. (1984). J. Opt. Soc. Am. A, 1, 612-619.
3. Haruta, K. (1965). J. Appl. Phys. 36, 1789-1790.
4. Herman, G. T. (1980). Image Reconstruction from Projections. New York: Academic Press.
5. Juul Jensen, D. (2000). Electron Backscatter Diffraction in Materials Science, edited by A. J. Schwartz, M. Kumar & B. L. Adams, pp. 91-104. New York: Plenum Press.
6. Labiche, J. C., Segura-Puchades, J., Van Brussel, D. & Moy, J. P. (1996). ESRF Newslett. 25, 41-43.
7. Lang, A. R. (1959). Acta Cryst. 12, 249-250.
8. Medrano, C., Rejmankova, P., Ohler, M. & Matsouli, I. (1997). Il Nuovo Cimento, 19D, 195-203.
9. Ohler, M., Sanchez del Rio, M., Tuffanelli, A., Gambaccini, M., Taibi, A., Fantini, A. & Pareschi, G. (2000). J. Appl. Cryst. 33, 1023-1030.
10. Servidori, M., Cembali, F. & Milita, S. (2001). Appl. Phys. A, 73, 75-82.
11. Tanner, B. K. (1976). X-ray Diffraction Topography. Oxford: Pergamon Press.