Three-dimensional plastic response in polycrystalline copper via near-field high-energy X-ray diffraction microscopy

Journal of Applied Crystallography

Volumn 45, Issue 6, 2012, Pages 1098-1108

  Li, S F ^a,b   Lind, J ^b   Hefferan, C M ^b   Pokharel, R ^b   Lienert, U ^c   Rollett, A D ^b   Suter, R M ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

diffraction imaging; near field high energy X ray diffraction microscopy; polycrystalline copper; three dimensional plastic response

Indexed keywords

ADVANCED PHOTON SOURCE; ANALYSIS METHOD; COMPLEX PATTERN; COMPUTATIONAL MODEL; CRYSTALLOGRAPHIC ORIENTATIONS; DIFFRACTION IMAGING; EXPERIMENTAL OBSERVATION; GOODNESS OF FIT; HIGH ENERGY X-RAY DIFFRACTION; LATTICE ROTATIONS; LENGTH SCALE; MIS-ORIENTATION; NEAR-FIELD; ORIENTATION FIELDS; ORIENTATIONAL DISORDER; PLASTIC RESPONSE; POLYCRYSTAL PLASTICITY; POLYCRYSTALLINE COPPER; POLYCRYSTALLINE SAMPLES; SCATTERING PATTERN; SIMULATED SCATTERING; SPATIAL VARIATIONS; STRAIN STATE; THREE DIMENSIONS; TRIANGULAR MESHES;

COPPER; NUCLEAR INSTRUMENTATION; THREE DIMENSIONAL; X RAY DIFFRACTION;

AMORPHOUS MATERIALS;

EID: 84869185746     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812039519     Document Type: Article

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