-
1
-
-
17144398749
-
A note on the plotting of accurate large-scale sterographic projections
-
Christian JW (1956) A note on the plotting of accurate large-scale sterographic projections. J Inst Metals 84:349-350
-
(1956)
J Inst Metals
, vol.84
, pp. 349-350
-
-
Christian, J.W.1
-
2
-
-
0031170838
-
Recent advances in the application of orientation imaging
-
Field DP (1997) Recent advances in the application of orientation imaging. Ultramicroscopy 67:1-9
-
(1997)
Ultramicroscopy
, vol.67
, pp. 1-9
-
-
Field, D.P.1
-
3
-
-
0003539132
-
-
New York and London: Plenum Press
-
Goldstein JI, Newbury DE, Echlin P, Joy DC, Romig AD Jr, Lyman CE, Fiori C (eds) (1992) Scanning Electron Microscopy and X-ray Microanalysis, 2nd ed., New York and London: Plenum Press
-
(1992)
Scanning Electron Microscopy and X-ray Microanalysis, 2nd Ed.
-
-
Goldstein, J.I.1
Newbury, D.E.2
Echlin, P.3
Joy, D.C.4
Romig Jr., A.D.5
Fiori C, L.C.E.6
-
4
-
-
0031171778
-
Grain boundary studies of high-temperature superconducting materials using electron backscatter Kikuchi diffraction
-
Goyal A, Specht ED, Wang ZL, Kroeger DM (1997) Grain boundary studies of high-temperature superconducting materials using electron backscatter Kikuchi diffraction. Ultramicroscopy 67:35-57
-
(1997)
Ultramicroscopy
, vol.67
, pp. 35-57
-
-
Goyal, A.1
Specht, E.D.2
Wang, Z.L.3
Kroeger, D.M.4
-
5
-
-
0019529896
-
Accurate microcrystallography at high spatial resolution using electron back-scattering patterns in a field emission gun scanning electron microscope
-
Harland CJ, Akhter P, Venables JA (1981) Accurate microcrystallography at high spatial resolution using electron back-scattering patterns in a field emission gun scanning electron microscope. J Phys E Sci Instrum, 14:175-182
-
(1981)
J Phys e Sci Instrum
, vol.14
, pp. 175-182
-
-
Harland, C.J.1
Akhter, P.2
Venables, J.A.3
-
6
-
-
0006929775
-
Spatial resolution measurements of electron backscatter diffraction patterns (EBSPs) in the scanning electron microscope
-
Peachey LD, Williams DB (eds). San Francisco: San Francisco Press
-
Hjelen J, Nes E (1990) Spatial resolution measurements of electron backscatter diffraction patterns (EBSPs) in the scanning electron microscope. In: Electron Microscopy: Materials Science, Peachey LD, Williams DB (eds). San Francisco: San Francisco Press, pp 404-405
-
(1990)
Electron Microscopy: Materials Science
, pp. 404-405
-
-
Hjelen, J.1
Nes, E.2
-
7
-
-
0031171333
-
Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM
-
Isabell TC, Dravid VP (1997) Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM. Ultramicroscopy 67:59-68
-
(1997)
Ultramicroscopy
, vol.67
, pp. 59-68
-
-
Isabell, T.C.1
Dravid, V.P.2
-
8
-
-
36749119332
-
Electron channeling patterns in the scanning electron microscope
-
Joy DC, Newbury DE, Davidson DL (1982) Electron channeling patterns in the scanning electron microscope. J Appl Phys 53(8):R81
-
(1982)
J Appl Phys
, vol.53
, Issue.8
-
-
Joy, D.C.1
Newbury, D.E.2
Davidson, D.L.3
-
10
-
-
0040912571
-
Spatial resolution of electron backscatter diffraction in a FEG-SEM
-
Bailey GW (ed). San Francisco: San Francisco Press
-
Kenik EA (1996) Spatial resolution of electron backscatter diffraction in a FEG-SEM. In: Microscopy & Microanalysis, Bailey GW (ed). San Francisco: San Francisco Press, pp 348-349
-
(1996)
Microscopy & Microanalysis
, pp. 348-349
-
-
Kenik, E.A.1
-
11
-
-
0343392878
-
Crystallographic phase identification in the scanning electron microscope: Backscattered electron Kikuchi patterns imaged with a CCD-based detector
-
Michael JR, Goehner RP (1993) Crystallographic phase identification in the scanning electron microscope: backscattered electron Kikuchi patterns imaged with a CCD-based detector. Microsc Soc Am Bull (23):168-175
-
(1993)
Microsc Soc Am Bull
, Issue.23
, pp. 168-175
-
-
Michael, J.R.1
Goehner, R.P.2
-
13
-
-
0028494533
-
Microtexture determination and its application to materials science
-
Weiland H (1994) Microtexture determination and its application to materials science. J Materials Sept:37-41
-
(1994)
J Materials
, vol.SEPT
, pp. 37-41
-
-
Weiland, H.1
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