Measuring stress distributions in Ti-6Al-4V using synchrotron X-ray diffraction

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 39, Issue 13, 2008, Pages 3120-3133

  Bernier, J V ^a   Park, J S ^b   Pilchak, A L ^c   Glavicic, M G ^d   Miller, M P ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Cornell University   (United States)

^c Ohio State University   (United States)

^d ROLLS ROYCE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; AGGREGATES; ALUMINUM; DIFFRACTION; DISTRIBUTION FUNCTIONS; ELECTROMAGNETIC WAVES; ELECTRON DIFFRACTION; POWDERS; SIGNAL TO NOISE RATIO; STRESS CONCENTRATION; SYNCHROTRONS; THREE DIMENSIONAL; TITANIUM ALLOYS;

CRYSTAL MODULUS; DWELL FATIGUES; ELECTRON BACKSCATTER DIFFRACTIONS; EXPERIMENTAL STATIONS; GEOMETRIC MODELS; HIGH ENERGY SYNCHROTRONS; IN-SITU; LATTICE STRAINS; MAXIMUM SHEAR STRESSES; MICROCRACK INITIATIONS; POLE FIGURES; PRISMATIC SLIPS; SIGNAL-TO-NOISE RATIOS; STRAIN ANALYSES; STRESS COMPONENTS; STRESS DISTRIBUTIONS; STRESS STATES; TI-6AL-4V; UNIAXIAL STRESSES; X-RAY DIFFRACTIONS;

CRYSTAL ORIENTATION;

EID: 56349145207     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-008-9639-6     Document Type: Conference Paper

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