Far-field high-energy diffraction microscopy: A tool for intergranular orientation and strain analysis

Journal of Strain Analysis for Engineering Design

Volumn 46, Issue 7, 2011, Pages 527-547

  Bernier, J V ^a   Barton, N R ^a   Lienert, U ^b   Miller, M P ^c  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Cornell University ^*  (United States)

Author keywords

3DXRD; Computer programs; HEDM; Polycrystalline materials; Strain tensor; Stress tensor; Synchrotron radiation; X ray diffraction

Indexed keywords

3DXRD; COMPUTER PROGRAM; HEDM; POLYCRYSTALLINE; STRAIN TENSOR; STRESS TENSOR;

CRYSTAL ORIENTATION; ELASTIC MODULI; HIGH ENERGY PHYSICS; INDEXING (OF INFORMATION); NUCLEAR INSTRUMENTATION; POLYCRYSTALLINE MATERIALS; STRESS ANALYSIS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

TENSORS;

EID: 81455128308     PISSN: 03093247     EISSN: 20413130     Source Type: Journal    
DOI: 10.1177/0309324711405761     Document Type: Article

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