Precision of lattice strain and orientation measurements using high-energy monochromatic X-ray diffraction

Journal of Applied Crystallography

Volumn 44, Issue 2, 2011, Pages 299-312

  Edmiston, John K ^a   Barton, Nathan R ^b   Bernier, Joel V ^b   Johnson, George C ^a   Steigmann, David J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

crystal lattice deformation; high energy; measurement uncertainties; orientation; strain; X ray diffraction

Indexed keywords

CLASSICAL METHODS; CRYSTAL LATTICE DEFORMATION; CRYSTALLINE LATTICE; DIFFRACTION DATA; DIFFRACTION PEAKS; HIERARCHICAL METHOD; HIGH ENERGY; LATTICE ORIENTATIONS; LATTICE STRAIN; MEASUREMENT UNCERTAINTY; MONOCHROMATIC X-RAY DIFFRACTIONS; ORIENTATION; ORIENTATION MEASUREMENTS; POLYCRYSTALLINE TITANIUM; REPEATED MEASUREMENTS; ROTATION PARAMETERS; SINGLE GRAINS; STANDARD STATISTICAL ANALYSIS; SYSTEMATIC FRAMEWORK; WEIGHTED LEAST SQUARES;

COMPUTERIZED TOMOGRAPHY; CRYSTAL LATTICES; CRYSTAL ORIENTATION; DEFORMATION; DIFFRACTION; HIGH ENERGY PHYSICS; LEAST SQUARES APPROXIMATIONS; MONOCHROMATORS; ROTATION; RUBY; SINGLE CRYSTALS; TITANIUM; TITANIUM ALLOYS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

UNCERTAINTY ANALYSIS;

EID: 79953030335     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811002123     Document Type: Article

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