A review of strain analysis using electron backscatter diffraction

Microscopy and Microanalysis

Volumn 17, Issue 3, 2011, Pages 316-329

  Wright, Stuart I ^a   Nowell, Matthew M ^a   Field, David P ^b  

^a EDAX TSL   (United States)

^b WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

elastic strain; electron backscatter diffraction (EBSD); orientation imaging microscopy (OIM); residual strain

Indexed keywords

EID: 79958785682     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000055     Document Type: Review

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