Orientation imaging microscopy: Emerging and future applications

Ultramicroscopy

Volumn 67, Issue 1-4, 1997, Pages 11-17

  Adams, Brent L ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Backscattering; Microdiffraction; Texture

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; GRAIN BOUNDARIES; IMAGING TECHNIQUES; POLYCRYSTALLINE MATERIALS; STATISTICAL METHODS; TEXTURES;

ELECTRON BACKSCATTER DIFFRACTION (EBSD); ORIENTATION IMAGING MICROSCOPY (OIM);

ELECTRON MICROSCOPY;

ARTICLE; CRYSTALLOGRAPHY; DIAGNOSTIC IMAGING; DIFFRACTION; GEOMETRY; IMAGING SYSTEM; MICROSCOPY; ORIENTATION; RELIABILITY; STRUCTURE ANALYSIS;

EID: 0031170819     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00103-9     Document Type: Article

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