Observation of recovery and recrystallization in high-purity aluminum measured with forward modeling analysis of high-energy diffraction microscopy

Acta Materialia

Volumn 60, Issue 10, 2012, Pages 4311-4318

  Hefferan, Christopher M ^a   Lind, Jonathan ^a   Li, Shiu Fai ^a   Lienert, Ulrich ^b   Rollett, Anthony D ^c   Suter, Robert M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Forward modeling; Microstructure; Recovery; Recrystallization; X ray diffraction

Indexed keywords

BULK GRAINS; DIFFRACTION MICROSCOPY; DIFFRACTION PEAKS; DISORDERED REGIONS; EXTERNAL STIMULUS; FORWARD MODELING; HIGH ENERGY; HIGH ENERGY X-RAY DIFFRACTION; HIGH-PURITY; INTENSITY PATTERNS; INTRAGRANULAR STRUCTURE; MATERIALS CHARACTERIZATION; NEAR-FIELD; NON DESTRUCTIVE; ORIENTATION MAPS; RECOVERY AND RECRYSTALLIZATION; SAMPLE SPACE; SIGNAL RECOVERY; THREE-DIMENSIONAL MICROSTRUCTURES;

ALUMINUM; COMPRESSIBLE FLOW; CRYSTALLIZATION; NUCLEAR INSTRUMENTATION; RECOVERY; RECRYSTALLIZATION (METALLURGY); X RAY DIFFRACTION;

MICROSTRUCTURE;

EID: 84861140698     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.04.020     Document Type: Article

References (24)

1. F.J. Humphreys, and M. Hatherly Recrystallization and related annealing phenomena 1995 Elsevier Oxford
2. H.F. Poulsen Three-dimensional X-ray diffraction microscopy 2004 Springer Berlin
3. R.M. Suter, D. Hennessy, C. Xiao, and U. Lienert Rev Sci Instrum 77 2006 1 12
4. U. Lienert, S.F. Li, and C.M. Hefferan J Miner Metals Mater Soc 63 2011 70 77
5. W. Liu, G.E. Ice, B.C. Larson, W. Yang, and J.Z. Tischler Ultramicroscopy 103 2005 199 204
6. B.C. Larson, W. Yang, G.E. Ice, J.D. Budai, and J.Z. Tischler Nature 415 2002 887 890
7. G. Johnson, A. King, M. Goncalves Honnicke, J. Marrow, and W. Ludwig J Appl Crystallogr 41 2008 310 318
8. W. Ludwig, S. Schmidt, E.M. Lauridsen, and H.F. Poulsen J Appl Crystallogr 41 2008 302 309
9. W. Ludwig, P. Reischig, A. King, M. Herbig, E.M. Lauridsen, and G. Johnson Rev Sci Instrum 80 2009 1 9
10. C. Gundlach, W. Pantleon, E.M. Lauridsen, L. Margulies, R.D. Doherty, and H.F. Poulsen Scr Mater 50 2004 477 481
11. E.M. Lauridsen, D. Juul Jensen, H.F. Poulsen, and U. Lienert Scr Mater 43 2000 561 566
12. S.E. Offerman, N.H. van Dijk, and J. Sietsma Science 298 2002 1003 1005
13. E.M. Lauridsen, H.F. Poulsen, S.F. Nielsen, and D. Juul Jensen Acta Mater 51 2003 4423 4435
14. S. Schmidt, S.F. Nielsen, C. Gundlach, L. Margulies, X. Huang, and D. Juul Jensen Science 305 2004 229 232
15. A.W. Larsen, H.F. Poulsen, L. Margulies, C. Gundlach, Q. Xing, and X. Huang Scr Mater 53 2005 553 557
16. E.M. Lauridsen, S. Schmidt, S.F. Nielsen, L. Margulies, H.F. Poulsen, and D. Juul Jensen Scr Mater 55 2006 51 56
17. A.D. Rollett, S.-B. Lee, R. Campman, and G.S. Rohrer Annu Rev Mater Sci 37 2007 627 658
18. C.M. Hefferan, S.F. Li, J. Lind, and R.M. Suter Powder Diffr 25 2010 132 137
19. C.M. Hefferan, S.F. Li, J. Lind, U. Lienert, A.D. Rollett, and P. Wynblatt Comput Mater Continuat 14 2009 209 219
20. Li SF. PhD thesis, Carnegie Mellon University, 2011.
21. S. Weissmann Characterization of lattice defects and concomitant strain distribution C.S. Barrett, Advances in X-ray analysis vol. 35A 1992 Plenum Press New York
22. L.N. Brewer, D.P. Field, and C.C. Merriman Mapping and assessing plastic deformation using EBSD A.J. Schwartz, Electron backscatter diffraction in materials science 2nd ed. 2009 Springer Science New York
23. R.D. Doherty Mater Sci Eng A 238 1997 219 274
24. Duggan B. ICOTOM 11, 1996; as quoted in [15].