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Volumn 23, Issue 45, 2012, Pages

Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy

(10) Pantzas, K a,b Patriarche, G c Troadec, D d Gautier, S b,e Moudakir, T b Suresh, S b Largeau, L c Mauguin, O c Voss, P L a,b Ougazzaden, A a,b

a GEORGIA TECH LORRAINE (France)

b GEORGIA INSTITUTE OF TECHNOLOGY (France)

c CNRS (France)

d INSTITUT D ELECTRONIQUE (France)

e SUPELEC (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MAPS; ELASTIC SCATTERING THEORY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; NANO-METER-SCALE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERING FUNCTIONS; TRANSMISSION MICROSCOPY;

ELASTIC SCATTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

GALLIUM COMPOUNDS;

EID: 84867961354 PISSN: 09574484 EISSN: 13616528 Source Type: Journal
DOI: 10.1088/0957-4484/23/45/455707 Document Type: Article

Times cited : (27)

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