Spontaneous stratification of InGaN layers and its influence on optical properties

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 6, Issue SUPPL. 2, 2009, Pages

  Liliental Weber, Z ^a   Yu, K M ^a   Hawkridge, M ^a   Bedair, S ^b   Berman, A E ^b   Emara, A ^b   Domagala, J ^c   Bak Misiuk, J ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b North Carolina State University   (United States)

^c INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CUBIC STRUCTURE; DIRECT CONTACT; HIGH DENSITY; HIGH RESOLUTION X RAY DIFFRACTION; LAYER THICKNESS; MOCVD; PHOTOLUMINESCENCE LINES; PLANAR DEFECT; POLYTYPES; RANDOMLY DISTRIBUTED; RECIPROCAL SPACE MAPS; RUTHERFORD BACK-SCATTERING; SAMPLE SURFACE; STRAINED LAYERS;

GALLIUM NITRIDE; LIGHT POLARIZATION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; STACKING FAULTS; X RAY DIFFRACTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955419891     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200880985     Document Type: Article

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