Role of surface amorphous film in high-resolution high-angle annular dark field STEM imaging

Ultramicroscopy

Volumn 99, Issue 2-3, 2004, Pages 125-135

  Yamazaki, T ^a   Watanabe, K ^b   Nakanishi, N ^a   Hashimoto, I ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

Author keywords

61.14.Dc; 61.16.Bg; 61.43.Dq; Amorphous film; Bethe method; HAADF; SiO2; STEM

Indexed keywords

AMORPHOUS FILMS; CRYSTALS; ELECTRON BEAMS; IMAGING TECHNIQUES; MOLECULAR STRUCTURE; MULTILAYERS; SILICA;

ANNULAR DETECTORS; IMAGE CONTRAST; SURFACE AMORPHOUS FILMS; THERMAL DIFFUSE SCATTERING;

TRANSMISSION ELECTRON MICROSCOPY;

SILICON DIOXIDE;

ARTICLE; BEAM THERAPY; CALCULATION; CRYSTAL; ELECTRON; EVALUATION; FILM; IMAGING; LIGHT SCATTERING; MATHEMATICAL COMPUTING; MOLECULAR DYNAMICS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THERMAL ANALYSIS;

EID: 11244325315     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.12.001     Document Type: Article

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