Operation of TEAM i in a user environment at NCEM

Microscopy and Microanalysis

Volumn 18, Issue 4, 2012, Pages 676-683

  Ercius, Peter ^a   Boese, Markus ^a   Duden, Thomas ^b   Dahmen, Ulrich ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b TD Scientific Engineering Services   (Germany)

Author keywords

aberration correction; direct electron detector; graphene; low voltage; piezo stage; STEM; TEAM; TEM

Indexed keywords

EID: 84864758514     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612001225     Document Type: Conference Paper

References (19)

1. Battaglia, M., Contarato, D., Denes, P., Doering, D., Duden, T., Krieger, B., Giubilato, P., Gnani, D. & Radmilovic, V. (2010). Characterisation of a CMOS active pixel sensor for use in the team microscope. Nucl Instrum Meth A 622(3), 669-677.
2. Battaglia, M., Contarato, D., Denes, P. & Giubilato, P. (2009). Cluster imaging with a direct detection CMOS pixel sensor in transmission electron microscopy. Nucl Instrum Meth A 608(2), 363-365.
3. Dahmen, U., Erni, R., Radmilovic, V., Ksielowski, C., Rossell, M.-D. & Denes, P. (2009). Background, status and future of the transmission electron aberration-corrected microscope project. Philos T R Soc A 367(1903), 3795-3808.
4. Duden, T. (2009). Capacitance displacement and rotation sensor. US Patent 2011/0175629.
5. Duden, T., Gautam, A. & Dahmen, U. (2011). Kspacenavigator as a tool for computer-assisted sample tilting in high-resolution imaging, tomography and defect analysis. Ultramicroscopy 111(11), 1574-1580.
6. Gianuzzi, L.A. & Stevie, F.A. (2004). Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. New York: Springer.
7. Girit, C.O., Meyer, J.C., Erni, R., Rossell, M.D., Kisielowski, C., Yang, L., Park, C.-H., Crommie, M.F., Cohen, M.L., Louie, S.G. & Zettl, A. (2009). Graphene at the edge: Stability and dynamics. Science 323(5922), 1705-1708.
8. Haider, M., Hartel, P., Miller, H., Uhlemann, S. & Zach, J. (2010). Information transfer in a TEM corrected for spherical and chromatic aberration. Microsc Microanal 16, 393-408.
9. Haider, M., Muller, H., Uhlemann, S., Zach, J., Loebau, U. & Hoeschen, R. (2008). Prerequisites for a Cc/Cs corrected ultrahigh-resolution TEM. Ultramicroscopy 108(3), 167-178.
10. Haider,M., Uhlemann, S. & Zach, J. (2000). Upper limits for the residual aberrations of a high-resolution aberration-corrected stem. Ultramicroscopy 81(3-4), 163-175.
11. Kaiser, U., Biskupek, J., Meyer, J., Leschner, J., Lechner, L., Rose, H., Stoger-Pollach, M., Khlobystov, A., Hartel, P., Muller, H., Haider, M., Eyhusen, S. & Benner, G. (2011). Transmission electron microscopy at 20kv for imaging and spectroscopy. Ultramicroscopy 111(8), 1239-1246.
12. Kisielowski, C., Freitag, B., Bischoff, M., van Lin, H., Lazar, S., Knippels, G., Tiemeijer, P., van der Stam, M., von Harrach, S., Stekelenburg, M., Haider, M., Uhlemann, S., Mller, H., Hartel, P., Kabius, B., Miller, D., Petrov, I., Olson, E., Donchev, T., Kenik, E., Lupini, A., Bentley, J., Pennycook, S., Anderson, I., Minor, A., Schmid, A., Duden, T., Radmilovic, V., Ramasse, Q., Watanabe, M., Erni, R., Stach, E., Denes, P. & Dahmen, U. (2008). Detection of single atoms and buried defects in three dimensions by aberrationcorrected electron microscope with 0.5-information limit. Microsc Microanal 14(5), 469-477.
13. Krivanek, O., Dellby, N. & Lupini, A. (1999). Towards subelectron beams. Ultramicroscopy 78(1-4), 1-11.
14. Lee, Z., Jeon, K.-J., Dato, A., Erni, R., Richardson, T.J., Frenklach, M. & Radmilovic, V. (2009). Direct imaging of soft/hard interfaces enabled by graphene. Nano Lett 9(9), 3365-3369.
15. Lee, Z., Meyer, J., Rose, H. & Kaiser, U. (2012). Optimum HRTEM image contrast at 20 kV and 80 kV-Exemplified by graphene. Ultramicroscopy 112(1), 39-46.
16. Schmid, A. & Andresen, N. (2011). Motorized manipulator for positioning a TEM specimen. US Patent 7,851,769.
17. van de Water, J., van den Oetelaar, J., Wagner, R., Slingerland, H., Bruggers, J., Ottevanger, A., Schmid, A., Olson, E., Petrov, I., Donchev, T. & Duden, T. (2011). Manipulator for rotating and translating a sample holder.US Patent 7,884,326.
18. Van den Broek, W., Van Aert, S. & Van Dyck, D. (2012). Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency.Microsc Microanal 18(2), 336-342.
19. Zemlin, F., Weiss, K., Schiske, P., Kunath, W. & Herrmann, K.-H. (1978). Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms. Ultramicroscopy 3, 49-60.