Aberrations of the cathode objective lens up to fifth order

Ultramicroscopy

Volumn 119, Issue , 2012, Pages 33-39

  Tromp, R M ^a,c   Wan, W ^b   Schramm, S M ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c LEIDEN UNIVERSITY   (Netherlands)

Author keywords

Aberration correction; Aberrations; Cathode lens; Low Energy Electron Microscopy (LEEM); Uniform field

Indexed keywords

ABERRATION COEFFICIENTS; ABERRATION CORRECTION; ABERRATION-CORRECTED; CATHODE LENS; CONTRAST TRANSFER FUNCTION; LOW ENERGY ELECTRON MICROSCOPY; OBJECTIVE LENS; PHOTOELECTRON EMISSION MICROSCOPY; SUBNANOMETER RESOLUTION; THEORETICAL EXPRESSION; THEORETICAL PREDICTION; UNIFORM FIELDS;

ABERRATIONS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTROSTATIC LENSES; EXPERIMENTS; IMAGE RESOLUTION;

CATHODES;

ABERRATION COEFFICIENT; ARTICLE; CONSTANTS AND COEFFICIENTS; ELECTRIC FIELD; INTERMETHOD COMPARISON; LENS POWER; MATHEMATICAL ANALYSIS; OPTICAL RESOLUTION; OPTICS;

EID: 84865357102     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.09.011     Document Type: Article

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