Technological shifts in surface metrology

CIRP Annals - Manufacturing Technology

Volumn 61, Issue 2, 2012, Pages 815-836

  Jiang, X Jane ^a   Whitehouse, David J ^b  

^a UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Characterisation; Surface metrology; Surface texture

Indexed keywords

CHARACTERISATION; FREEFORM SHAPES; FUNCTIONAL APPLICATIONS; MACHINED SURFACE; SURFACE CLASSIFICATION; SURFACE METROLOGY; SURFACE TEXTURES; TECHNOLOGICAL CHANGE;

MEASUREMENTS;

UNITS OF MEASUREMENT;

EID: 84865696363     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2012.05.009     Document Type: Article

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