Paradigm shifts in surface metrology. Part I. Historical philosophy

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 463, Issue 2085, 2007, Pages 2049-2070

  Jiang, X ^a   Scott, P J ^a,c   Whitehouse, D J ^a,b,c   Blunt, L ^a  

^a UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c Taylor and Hobson Ltd   (United Kingdom)

Author keywords

Characterization; Filtration; Instrumentation; Measurement; Standardization; Surface texture

Indexed keywords

EID: 36349033589     PISSN: 13645021     EISSN: 14712946     Source Type: Journal    
DOI: 10.1098/rspa.2007.1874     Document Type: Review

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