Wavelets and their applications for surface metrology

CIRP Annals - Manufacturing Technology

Volumn 57, Issue 1, 2008, Pages 555-558

  Jiang, X ^a   Scott, P ^a,b   Whitehouse, D ^a,b  

^a UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

^b Taylor and Hobson Ltd   (United Kingdom)

Author keywords

Analysis; Surface; Wavelet

Indexed keywords

BIOMEDICAL ENGINEERING; FEATURE EXTRACTION; INVARIANCE; MEASUREMENTS; WAVELET ANALYSIS;

BIORTHOGONAL WAVELETS; SURFACE RECOGNITION;

SURFACES;

EID: 43649090319     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2008.03.110     Document Type: Article

References (11)

1. Whitehouse D.J. Handbook of Surface Metrology (1994), Institute of Physics, Bristol/Philadelphia
2. Jiang X., Scott P., Whitehouse D., and Blunt L. Paradigm Shifts in Surface Metrology Part I: Historical Philosophy. Proceeding of the Royal Society of London A 463 (2007) 2049-2070
3. De Chiffre L., Kunzmann H., Peggs G.N., and Lucca D.A. Surfaces in Precision Engineering, Microengineering and Nanotechnology. Annals of the CIRP 52 2 (2003) 561-578
4. Daubechies I. Ten Lectures on Wavelets. 1st ed. (1992), SIAM, Philadelphia
5. Jiang X., Blunt L., and Stout K.J. Three-dimensional Surface Characterization for Orthopaedic Joint Prostheses. Proceedings of the Institute of Mechanical Engineers H 213 (1999) 49-68
6. Jiang X., Blunt L., and Stout K.J. Development of a Lifting Wavelet Representation for Characterisation of Surface Topography. Proceeding of the Royal Society of London A 456 (2000) 2283-2313
7. Swelden W. The Lifting Scheme: A New Philosophy in Biorthogonal Wavelet Constructions (1996), Bell Laboratories, USA
8. ISO/TS 16610-29 (2006) Geometrical Product Specifications (GPS) - Filtration - Part 29: Linear Profile Filters, Spline Wavelets, ISO, Geneva.
9. Jiang X., and Blunt L. Third Generation Wavelet for the Extraction of Morphological Features from Micro and Nano Scalar Surfaces. Wear 257 (2004) 1235-1240
10. Kingsbury N. Complex Wavelets for Shift Invariant Analysis and Filtering of Signals. Journal of Applied and Computational Harmonic Analysis 10 3 (2001) 234-253
11. Zeng W., Jiang X., and Scott P.J. Metrological Characteristics of Dual Tree Complex Wavelet Transform for Surface Analysis. Measurement Science and Technology 16 (2005) 1410-1417