Feature extraction for structured surface based on surface networks and edge detection

Materials Science in Semiconductor Processing

Volumn 9, Issue 1-3, 2006, Pages 210-214

  Xiao, S ^a   Xie, F ^a   Blunt, L ^a   Scott, P ^a   Jiang, X ^a  

^a UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

Author keywords

Edge detection; Morphological feature; Surface network; Surface segmentation

Indexed keywords

COMPUTER NETWORKS; EDGE DETECTION; GEOMETRICAL OPTICS; GRAIN BOUNDARIES; IMAGE SEGMENTATION; MATERIALS SCIENCE;

MORPHOLOGICAL FEATURE; SADDLE POINTS; SURFACE NETWORKS; SURFACE SEGMENTATION;

FEATURE EXTRACTION;

EID: 33744541303     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2006.01.085     Document Type: Article

References (7)

1. Singleton L, Leach R, Lewis A, Cui Z. Report on the analysis of the MEMSTAND survey on Standardisation of MicroSystems technology MEMSTAND Project IST-2001-37682, 2002.
2. Blunt L., and Jiang X. Advanced Techniques for Assessment Surface Topography. first ed (2003), Penton Press, London
3. Scott P.J. Pattern analysis and metrology: the extraction of stable features from observable measurements. Proc R Soc London, Seri A 460 (2004) 2845-2864
4. Lezoray O., and Cardot H. Histogram and watershed based segmentation of color images. Technical report (2000), University of Caen, France
5. Guoyi F., Hojjat S.A., and Colchester A.C.F. Integrating watersheds and critical point analysis for object detection in discrete 2D images. Med Image Anal 8 (2004) 177-185
6. Trémeau N.B. A region growing and merging algorithm to color segmentation. Pattern Recognition 30 7 (1998) 1191
7. Heath M, Sarkar S, Sanocki T, Bowyer K. Comparison of edge detectors: a methodology and initial study. In: Computer Vision and Pattern Recognition '96, San Francisco, June, 1996.