Foundations of topological characterization of surface texture

International Journal of Machine Tools and Manufacture

Volumn 38, Issue 5-6, 1998, Pages 559-566

  Scott, Paul J ^a  

^a Taylor and Hobson Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SURFACE PROPERTIES; TOPOLOGY;

TOPOLOGICAL CHARACTERIZATION;

SURFACE ROUGHNESS;

EID: 0032065805     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0890-6955(97)00102-8     Document Type: Article

References (5)

1. E000.14.015.N Août 1983 Etats geometriques de surface calcul des criteres de profil, C.N.O.M.O.
2. ISO 12 085 Geometrical Product Specifications (GPS) - Surface texture - Profile method - Motif method for measurement of surface roughness and waviness.
3. Ahmose; (mid 16th century BC), "The Rhind Mathematical Papyrus", Year 33 of the reign of King Auserre (Apophis), Fifteenth Dynasty, second intermediate period Ancient Egypt.
4. Maxwell, J.C.; (1870), On hills and dales, The London, Edinburgh, and Dublin Phil. Mag. and J. Sci., Series 4, 40, pp 421-425.
5. Kweon, I.S. & Kanade, T.; (1994), Extracting topographic terrain features from elevation maps, CVGIP: image understanding, 59, no 2, pp 171-182.