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Volumn 97, Issue , 2012, Pages 96-99

Scanning probe nanolithography on calixarene

Author keywords

Calixarene; Molecular resist; Nanofabrication; Scanning probe lithography (SPL); STM lithography

Indexed keywords

AMBIENT CONDITIONS; CALIXARENES; CONSTANT-CURRENT; DIRECT-PATTERNING; FOWLER-NORDHEIM; MOLECULAR RESISTS; POSITIVE-TONE; PROCESS LATITUDES; PROXIMITY EFFECTS; RESORCINARENE; SCANNING PROBE LITHOGRAPHY; SCANNING PROBE NANO-LITHOGRAPHY; SCANNING PROBES; SILICON SUBSTRATES; STM-LITHOGRAPHY; TIP SPEED;

EID: 84865478470     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2012.05.042     Document Type: Article
Times cited : (33)

References (34)
  • 11
    • 0033204218 scopus 로고    scopus 로고
    • S. Xu Langmuir 15 1999 7244
    • (1999) Langmuir , vol.15 , pp. 7244
    • Xu, S.1
  • 18
    • 77952154268 scopus 로고    scopus 로고
    • D. Pires Science 328 2010 732
    • (2010) Science , vol.328 , pp. 732
    • Pires, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.