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Volumn 83, Issue 4-9 SPEC. ISS., 2006, Pages 1115-1118

Chemically amplified molecular resists for electron beam lithography

Author keywords

Electron beam lithography; Fullerene; Molecular resist; Triphenylene

Indexed keywords

CARBON; FULLERENES; IRRADIATION; POLYMERS; SENSITIVITY ANALYSIS; SURFACE ROUGHNESS;

EID: 33748280238     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.01.151     Document Type: Article
Times cited : (33)

References (17)
  • 2
    • 33748275010 scopus 로고    scopus 로고
    • International Sematech Roadmap, 2004.
  • 15
    • 33748266011 scopus 로고    scopus 로고
    • A.P.G. Robinson, H.M. Zaid, M. Manickam, J.A. Preece, R.E. Palmer, unpublished.
  • 16
    • 33748271401 scopus 로고    scopus 로고
    • H.M. Zaid, A.P.G. Robinson, M. Manickam, J.A. Preece, R.E. Palmer, unpublished.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.