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Volumn 101, Issue 7, 2012, Pages

Highly (111)-oriented Ge thin films on insulators formed by Al-induced crystallization

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; CONTROLLING PROCESS; GE ON INSULATORS; GE SURFACES; GE THIN FILMS; HIGH QUALITY; LOW TEMPERATURE ANNEALING; PHOTOVOLTAIC APPLICATIONS;

EID: 84865405725     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4744962     Document Type: Article
Times cited : (97)

References (22)
  • 1
    • 33750919479 scopus 로고    scopus 로고
    • Low-temperature formation (<500 °c) of poly-Ge thin-film transistor with NiGe Schottky source/drain
    • DOI 10.1063/1.2387136
    • T. Sadoh, H. Kamizuru, A. Kenjo, and M. Miyao, Appl. Phys. Lett. 89, 192114 (2006). 10.1063/1.2387136 (Pubitemid 44729696)
    • (2006) Applied Physics Letters , vol.89 , Issue.19 , pp. 192114
    • Sadoh, T.1    Kamizuru, H.2    Kenjo, A.3    Miyao, M.4
  • 7
    • 34948851463 scopus 로고    scopus 로고
    • A very low temperature single crystal germanium growth process on insulating substrate using Ni-induced lateral crystallization for three-dimensional integrated circuits
    • DOI 10.1063/1.2793183
    • J. H. Park, P. Kapur, K. C. Saraswat, and H. Peng, Appl. Phys. Lett. 91, 143107 (2007). 10.1063/1.2793183 (Pubitemid 47531550)
    • (2007) Applied Physics Letters , vol.91 , Issue.14 , pp. 143107
    • Park, J.-H.1    Kapur, P.2    Saraswat, K.C.3    Peng, H.4
  • 10
    • 0001761088 scopus 로고    scopus 로고
    • Aluminum-induced crystallization of amorphous silicon on glass substrates above and below the eutectic temperature
    • DOI 10.1063/1.122722, PII S0003695198011486
    • O. Nast, T. Puzzer, L. M. Koschier, A. B. Sproul, and S. R. Wenham, Appl. Phys. Lett. 73, 3214 (1998). 10.1063/1.122722 (Pubitemid 128677358)
    • (1998) Applied Physics Letters , vol.73 , Issue.22 , pp. 3214-3216
    • Nast, O.1    Puzzer, T.2    Koschier, L.M.3    Sproul, A.B.4    Wenham, S.R.5
  • 11
    • 37149000922 scopus 로고    scopus 로고
    • Mechanism of aluminum-induced layer exchange upon low-temperature annealing of amorphous Si/polycrystalline Al bilayers
    • DOI 10.1063/1.2822275
    • J. Y. Wang, Z. M. Wang, and E. J. Mittemeijer, J. Appl. Phys. 102, 113523 (2007). 10.1063/1.2822275 (Pubitemid 350262095)
    • (2007) Journal of Applied Physics , vol.102 , Issue.11 , pp. 113523
    • Wang, J.Y.1    Wang, Z.M.2    Mittemeijer, E.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.