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Volumn 97, Issue 8, 2010, Pages

Interface-controlled layer exchange in metal-induced crystallization of germanium thin films

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; ELECTRONICS APPLICATIONS; GE THIN FILMS; INDUCED CRYSTALLIZATION; INTERFACIAL DIFFUSION; LATERAL OVERGROWTH; LAYER EXCHANGE; LOW TEMPERATURE SYNTHESIS; METAL-INDUCED CRYSTALLIZATION; POLYCRYSTALLINE GERMANIUM; POLYMER SUBSTRATE; PREFERRED ORIENTATIONS;

EID: 77956214731     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3480600     Document Type: Article
Times cited : (75)

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    • 'Explosive' crystallisation of amorphous germanium in Ge/Al layer systems; comparison with Si/Al layer systems
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.