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Volumn 208, Issue 1, 2012, Pages 305-318

Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges

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EID: 84862604152     PISSN: 19516355     EISSN: 19516401     Source Type: Journal    
DOI: 10.1140/epjst/e2012-01626-y     Document Type: Review
Times cited : (17)

References (68)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.