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Journal of Applied Physics

Volumn 107, Issue 2, 2010, Pages

Probing porosity at buried interfaces using soft x-ray resonant reflectivity

(5) Nayak, Maheswar a Lodha, G S a Prasad, T T a Nageswararao, P a Sinha, A K a

a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY (India)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; BI-LAYER STRUCTURE; BURIED INTERFACE; POROUS LAYERS; REFLECTIVITY PROFILES; RESONANT REFLECTIVITY; SCATTERING CONTRAST; SIGN REVERSAL; SOFT X-RAY;

ABSORPTION; BORON; BORON CARBIDE; ELECTRON BEAMS; OPTICAL CONSTANTS; REFRACTIVE INDEX;

REFLECTION;

EID: 75749115195 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3295915 Document Type: Article

Times cited : (10)

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