Soft x-ray resonant reflectivity of low- Z material thin films

Applied Physics Letters

Volumn 87, Issue 21, 2005, Pages 1-3

  Wang, Cheng ^a   Araki, T ^a   Ade, H ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; CHEMICAL MOIETIES; CHEMICAL SPECIFICITY; RESONANT REFLECTIVITY;

CARBON; LIGHT ABSORPTION; LIGHT REFLECTION; NEUTRON REFLECTION; POLYMERS; SAMPLING; SYNTHESIS (CHEMICAL); X RAY ANALYSIS;

THIN FILMS;

EID: 27844573482     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2136353     Document Type: Article

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