Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surface

Applied Surface Science

Volumn 257, Issue 1, 2010, Pages 210-214

  Gupta, Pooja ^a   Sinha, A K ^a   Modi, M H ^a   Gupta, S M ^a   Gupta, P K ^a   Deb, S K ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Optical constants; Resonant reflectivity; Surface density; Zinc sulphide

Indexed keywords

CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; ELECTRONIC DENSITY OF STATES; ELECTRONS; II-VI SEMICONDUCTORS; MULTILAYERS; OPTICAL CONSTANTS; REFLECTION; SULFUR; SULFUR COMPOUNDS; ZINC SULFIDE;

INDUS-1 SYNCHROTRONS; INTERMEDIATE LAYERS; L3 ABSORPTION EDGE; RESONANT REFLECTIVITY; SENSITIVE PROBE; SOFT X-RAY REGIONS; SOFT-X-RAY REFLECTIVITY; SURFACE DENSITY;

X RAYS;

EID: 77955510620     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.06.066     Document Type: Article

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