Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis

Review of Scientific Instruments

Volumn 83, Issue 4, 2012, Pages

  Gann, E ^a   Young, A T ^b   Collins, B A ^a   Yan, H ^a,b   Nasiatka, J ^b   Padmore, H A ^b   Ade, H ^a   Hexemer, A ^b   Wang, C ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED LIGHT SOURCE; BEAM LINES; CARBON K-EDGE; DETECTOR NOISE; HIGHER HARMONICS; OPERATIONAL CHARACTERISTICS; POLARIZATION CONTROL; PRELIMINARY DATA; REAL-TIME DATA PROCESSING; SOFT MATTER; SOFT X-RAY; SPECTRAL PURITY; USER FRIENDLY INTERFACE; WIDE ENERGY RANGE; X RAY BEAM;

LIGHT SOURCES; X RAY SCATTERING; X RAYS;

SCATTERING;

EID: 84860585013     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3701831     Document Type: Review

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