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European Physical Journal: Special Topics

Volumn 167, Issue 1, 2009, Pages 121-126

The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers

(10) Swaraj, S a Wang, C a,c Araki, T a Mitchell, G b Liu, L b Gaynor, S b Deshmukh, B b Yan, H a McNeill, C R d Ade, H a

a NORTH CAROLINA STATE UNIVERSITY (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c DOW CHEMICAL COMPANY (United States)

d UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 63749120837 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2009-00946-3 Document Type: Article

Times cited : (38)

References (18)

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