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Volumn 103, Issue 22, 1999, Pages 4603-4610

Near-edge X-ray absorption fine structure spectroscopy of MDI and TDI polyurethane polymers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001694209     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp990059w     Document Type: Article
Times cited : (50)

References (37)
  • 17
    • 0003748653 scopus 로고
    • Electron Energy Loss Studies in Semiconductors
    • Disko, M. M., Ahn, C. C., Fultz, B., Eds.; The Minerals, Metals and Materials Society: Warrendale, PA
    • Batson, P. E. Electron Energy Loss Studies in Semiconductors. In Transmission Electron Energy Loss Spectrometry in Materials Science; Disko, M. M., Ahn, C. C., Fultz, B., Eds.; The Minerals, Metals and Materials Society: Warrendale, PA, 1992; p 217.
    • (1992) Transmission Electron Energy Loss Spectrometry in Materials Science , pp. 217
    • Batson, P.E.1
  • 37
    • 20544432447 scopus 로고    scopus 로고
    • M.Sc Thesis, North Carolina State University, Raleigh, NC
    • Coffey, T. S. M.Sc Thesis, North Carolina State University, Raleigh, NC, 1998.
    • (1998)
    • Coffey, T.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.