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Volumn 20, Issue 3, 2008, Pages 528-534

Imaging the interfaces of conjugated polymer optoelectronic devices

Author keywords

[No Author keywords available]

Indexed keywords

CONJUGATED POLYMERS; DISSOLUTION; ELECTROOPTICAL DEVICES; FILMS; METAL RECOVERY; MICROSCOPIC EXAMINATION; MOLECULAR ELECTRONICS; MULTILAYER FILMS; MULTILAYERS; OPTOELECTRONIC DEVICES; POLYMERS; SPIN COATING;

EID: 41449096741     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200700887     Document Type: Article
Times cited : (52)

References (53)
  • 44
    • 54949155881 scopus 로고    scopus 로고
    • - is - 1.4 nm as determined by the soft X-ray reflectivity. K. Sohn, A. Garcia, G. Bazan, E. Kramer, H. Aide, T.-Q. Nguyen, unpublished.
    • - is - 1.4 nm as determined by the soft X-ray reflectivity. K. Sohn, A. Garcia, G. Bazan, E. Kramer, H. Aide, T.-Q. Nguyen, unpublished.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.