Determination of interlayer composition at buried interfaces using soft x-ray resonant reflectivity

Applied Physics Letters

Volumn 89, Issue 18, 2006, Pages

  Nayak, Maheswar ^a   Lodha, G S ^a   Sinha, A K ^a   Nandedkar, R V ^a   Shivashankar, S A ^b  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; LIGHT SCATTERING; MULTILAYERS; REFLECTION; RESONANCE; X RAYS;

ENERGY DEPENDENT ATOMIC SCATTERING; INTERLAYER COMPOSITION; RESONANT REFLECTIVITY; SUBNANOMETER SENSITIVITY;

INTERFACES (MATERIALS);

EID: 33750725750     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2374865     Document Type: Article

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