Investigation of the micellization in thin films using resonant soft x-Ray scattering

IOP Conference Series: Materials Science and Engineering

Volumn 14, Issue 1, 2010, Pages

  Pavlopoulou, E ^a,b   Anastasiadis, S H ^a,b   Kortright, J B ^c   Bras, W ^d   Portale, G ^d  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b UNIVERSITY OF CRETE   (Greece)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; COPOLYMERIZATION; ESTERS; MICELLES; PLASTIC PRODUCTS; POLYMERS; POLYSTYRENES; SCATTERING; SUBSTRATES; SUN; SYNCHROTRON RADIATION; SYNCHROTRONS; THIN FILMS; X RAY LITHOGRAPHY; X RAYS;

BLOCK COPOLYMER MICELLES; COPOLYMER CHAINS; COPOLYMER CONCENTRATION; COPOLYMER MICELLES; CORE RADIUS; EXPERIMENTAL DATA; HARD X RAY; HIGH MOLECULAR WEIGHT; HOMOPOLYMERS; MATRIX; NUMBER DENSITY; SOFT X-RAY;

PLASTIC COATINGS;

EID: 84862622610     PISSN: 17578981     EISSN: 1757899X     Source Type: Conference Proceeding    
DOI: 10.1088/1757-899X/14/1/012017     Document Type: Conference Paper

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