Molecular bond selective x-ray scattering for nanoscale analysis of soft matter

Applied Physics Letters

Volumn 89, Issue 4, 2006, Pages

  Mitchell, G E ^a   Landes, B G ^a   Lyons, J ^a   Kern, B J ^a   Devon, M J ^a   Koprinarov, I ^b   Gullikson, E M ^c   Kortright, J B ^c  

^a DOW CHEMICAL COMPANY   (United States)

^b MCMASTER UNIVERSITY   (Canada)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSITIVE IMAGING; HIGH SPATIAL RESOLUTION; MOLECULAR BOND; NANOSCALE ANALYSIS;

CHEMICAL BONDS; IMAGING TECHNIQUES; SENSITIVITY ANALYSIS; STRUCTURE (COMPOSITION); THIN FILMS; X RAY SCATTERING;

NANOSTRUCTURED MATERIALS;

EID: 33746635592     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2234301     Document Type: Article

References (24)

1. F. J. Balta-Calleja and C. G. Vonk, X-ray Scattering of Synthetic Polymers (Elsevier, Amsterdam, 1989).
2. B. Lee, W. Oh, J. Yoon, Y. Hwang, J. Kim, B. G. Landes, J. P. Quintana, and M. Ree, Macromolecules 38, 8991 (2005).
3. O. Glatter and O. Kratky, Small Angle X-Ray Scattering (Academic, New York, 1982).
4. H. Ade, X. Zhang, S. Cameron, C. Costello, J. Kirz, and S. Williams, Science 258, 972 (1992).
5. T. P. Russell, Physica B 221, 267 (1996).
6. M. S. Silverstein, M. Shach-Caplan, B. J. Bauer, R. C. Hedden, H.-J. Lee, and B. G. Landes, Macromolecules 38, 4301 (2005).
7. Modern Techniques for Polymer Characterization, edited by R. A. Pethrick and J. V. Dawkins (Wiley, New York, 1999), Chap. 7.
8. D. Richter, Physica B 276-278, 22 (2000).
9. Advances in Scanning Probe Microscopy of Polymers, edited by V. V. Tsukruk and N. D. Spencer (Wiley-VCH, Weinheim, 2001).
10. O. Dhez, H. Ade, and S. G. Urquhart, J. Electron Spectrosc. Relat. Phenom. 128, 85 (2003).
11. J. Stöhr, NEXAFS Spectroscopy (Springer, Berlin, 1992).
12. A. L. D. Kilcoyne, T. Tyliszczak, W. F. Steele, S. Fakra, P. Hitchcock, K. Franck, E. Anderson, B. Harteneck, E. G. Rightor, G. E. Mitchell, A. P. Hitchcock, L. Yang, T. Warwick, and H. Ade, J. Synchrotron Radiat. 10, 125 (2003).
13. W. A. Hendrickson, Science 254, 51 (1991).
14. P. H. Fuoss, P. Eisenberger, W. K. Warburton, and A. Bienenstock, Phys. Rev. Lett. 46, 1537 (1981).
15. D. Gibbs, D. R. Harshman, E. D. Isaacs, D. B. McWhan, D. Mills, and C. Vettier, Phys. Rev. Lett. 61, 1241 (1988).
16. H. Dürr, E. Dudzik, S. S. Dhesi, J. B. Goedkoop, G. van der Laan, M. Belakhovsky, C. Mocuta, A. Marty, and Y. Samson, Science 284, 2166 (1999).
17. P. Abbamonte, L. Venema, A. Rusydi, G. A. Sawatzky, G. Logvenov, and I. Bozovic, Science 297, 581 (2002).
18. S. B. Wilkins, P. D. Hatton, M. D. Roper, D. Prabhakaran, and A. T. Boothroyd, Phys. Rev. Lett. 90, 187201 (2003).
19. C. F. Welch, R. P. Hjelm, J. T. Mang, D. A. Wrobleski, E. B. Orler, M. E. Hawley, and J. B. Kortright, Polym. Mater. Sci. Eng. 93, 289 (2005).
20. T. Araki, H. Ade, J. M. Stubbs, D. C. Sundberg, G. Mitchell, J. B. Kortright, and A. L. D. Kilcoyne, Appl. Phys. Lett, (to be published).
21. C. Wang, T. Araki, and H. Ade, Appl. Phys. Lett. 87, 214109 (2005).
22. J. B. Kortright and S.-K. Kim, Phys. Rev. B 62, 12216 (2000).
23. B. L. Henke and J. W. M. Dumond, J. Appl. Phys. 26, 903 (1955).
24. R. D. Miller, Science 286, 421 (1999).